Semiconductor device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07071719

ABSTRACT:
A semiconductor device includes at least three circuit substrates laid one upon another. The device further includes first circuit elements mounted, respectively, on at least two of the three circuit substrates. It also includes a second circuit element mounted on one of the three circuit substrates and configured to change connection between the first circuit elements.

REFERENCES:
patent: 6055655 (2000-04-01), Momohara
patent: 6122171 (2000-09-01), Akram et al.
patent: 6437589 (2002-08-01), Sugano
patent: 6597187 (2003-07-01), Eldridge et al.
patent: 6684345 (2004-01-01), Harari et al.
patent: 6774478 (2004-08-01), Eto et al.
patent: 62-237741 (1987-10-01), None
patent: 5-13662 (1993-01-01), None
patent: 10-65104 (1998-03-01), None
patent: 2001-250908 (2001-09-01), None

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