Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-07-04
2006-07-04
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07071719
ABSTRACT:
A semiconductor device includes at least three circuit substrates laid one upon another. The device further includes first circuit elements mounted, respectively, on at least two of the three circuit substrates. It also includes a second circuit element mounted on one of the three circuit substrates and configured to change connection between the first circuit elements.
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Hayashi Kiyotaka
Sato Tsunehiro
Hogan & Hartson LLP
Hollington Jermele
Kabushiki Kaisha Toshiba
Nguyen Tung X.
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