Position detection apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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C250S548000

Reexamination Certificate

active

06992766

ABSTRACT:
A method of detecting a position of a mark within image data. The method includes a first step of obtaining a first position of the mark based on a first degree of correlation between a first template and the image data, the first template having a first feature point to obtain the first degree of correlation, a second step of obtaining a second position of the mark based on a second degree of correlation between a second template and the image data, the second template having a second feature point, of which a position is different from that of the first feature point, to obtain the second degree of correlation, and a third step of detecting the position of the mark through the first and second steps.

REFERENCES:
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patent: 5543921 (1996-08-01), Uzawa et al.
patent: 5774575 (1998-06-01), Tanaka et al.
patent: 6521385 (2003-02-01), Yoshida et al.
patent: 6803592 (2004-10-01), Yoshida
patent: 2002/0036777 (2002-03-01), Tanaka
patent: 2002/0154283 (2002-10-01), Tanaka et al.
patent: 2004/0223157 (2004-11-01), Nakajima
patent: 10-97983 (1998-04-01), None
patent: 2000-260699 (2000-09-01), None

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