Interferometric servo control system for stage metrology

Optics: measuring and testing – By light interference – Having light beams of different frequencies

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S500000

Reexamination Certificate

active

07046367

ABSTRACT:
The invention features a method for determining non-linear cyclic errors in a metrology system that positions a measurement object under servo-control based on an interferometrically derived position signal. The method includes: translating the measurement object under servo-control at a fixed speed; identifying frequencies of any oscillations in the position of measurement object as it is translated at the fixed speed; and determining amplitude and phase coefficients for sinusoidal components at the identified frequencies which when combined with the position signal suppress the oscillations. The invention also features a method for positioning a measurement object under servo-control based on an interferometrically derived position signal indicative of a position for the measurement object. This method includes: generating a compensated position signal based on the interferometrically derived position signal and at least one correction term that has a sinusoidal dependence on the position of the measurement object; and repositioning the measurement object based on the compensated position signal and a desired position for the measurement object.

REFERENCES:
patent: 4413908 (1983-11-01), Abrams et al.
patent: 4948254 (1990-08-01), Ishida
patent: 5331400 (1994-07-01), Wilkening et al.
patent: 5404222 (1995-04-01), Lis
patent: 5483343 (1996-01-01), Iwamoto et al.
patent: 5663893 (1997-09-01), de Groot
patent: 5940180 (1999-08-01), Ostby
patent: 5969800 (1999-10-01), Makinouchi
patent: 6008902 (1999-12-01), Rinn
patent: 6137574 (2000-10-01), Hill
patent: 6181420 (2001-01-01), Badami et al.
patent: 6246481 (2001-06-01), Hill
patent: 6252668 (2001-06-01), Hill
patent: 6747744 (2004-06-01), Hill
patent: 6806961 (2004-10-01), Hill
patent: 6891624 (2005-05-01), Hill
patent: 2002/0048026 (2002-04-01), Isshiki et al.
patent: 2002/0089671 (2002-07-01), Hill
patent: 2002/0171844 (2002-11-01), Hill
patent: 2004/0085545 (2004-05-01), Hill
patent: 351078 (1995-12-01), None
patent: 117083 (1996-04-01), None
Badami V.B. et al., “Investigation of Nonlinearity in High Accuracy Heterodyne Laser Interferometry,” 1997 Proceedings, vol. 16, pp. 153-156.
Bobroff, N., “Recent Advances in Displacement Measuring Interferometry,” Measurement Science & Technology, vol. 4, Lo. 9, Sep. 1993, pp. 907-926.
Hines, B. et al., “Sub-Nanometer Laser Metrology—Some Techniques and Models,” Jet Propulsion Laboratory, California Institute of Technology, pp. 1195-1204.
Oka K. et al., “Polarization Heterodyne Interferometry Using Another local Oscillator Beam,” Optics Communications, 92 (1982), 1-5.
Wu, C.M. et al., Analytical Modeling of the Periodic Nonlinearity in Heterodyne Interferometry Applied Optics, vol. 37, No. 28, Oct. 1, 1998, pp. 6696-6700.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Interferometric servo control system for stage metrology does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Interferometric servo control system for stage metrology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric servo control system for stage metrology will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3582247

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.