Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-26
2006-09-26
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S060000, C324S076410
Reexamination Certificate
active
07113877
ABSTRACT:
A method, apparatus, and system for detecting a signal of interest. According to some embodiments, a power of a frequency component of a signal is determined. The power is accumulated for a first period and a second period, the second period being shorter than the first period. Power spectrum information may be found, and high and normalized power spectrum information may be determined and compared.
REFERENCES:
patent: 5627759 (1997-05-01), Bearden et al.
patent: 6094449 (2000-07-01), Komatsu
patent: 6941237 (2005-09-01), Jenrette
Buckley Maschoff & Talwalkar LLC
Bui Bryan
Intel Corporation
Walling Meagan S
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