Method and device for the determination of the thickness of...

Details Method and device for the determination of the thickness of... Method and device for the determination of the thickness of...

2006-03-28

2006-03-28

Bruce, David V. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S044000

Reexamination Certificate

active

07020239

ABSTRACT:
Method for the determination of the thickness of the insulation of a flat ribbon cable in the region of the metallic conductor paths, wherein one side of the flat ribbon cable is irradiated by means of an x-ray beam, and a detector on the same or on the opposing side of the flat ribbon cable measures the intensity of the x-ray luminescence radiation emitted by the respective conductor paths, the detector being shielded against the x-ray radiation.

REFERENCES:
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patent: 4129778 (1978-12-01), Inoue et al.
patent: 5195117 (1993-03-01), Ong
patent: 27 47 638 (1978-06-01), None
patent: 100 19 789 (2001-04-01), None
patent: 199 50 254 (2001-05-01), None
patent: 100 34 747 (2002-02-01), None
patent: 2 132 343 (1984-07-01), None
patent: 01/11316 (2001-02-01), None

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