Method for optimizing inspection speed in low, and...

Details Method for optimizing inspection speed in low, and... Method for optimizing inspection speed in low, and...

2006-03-21

2006-03-21

Porta, David (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

C250S559460

Reexamination Certificate

active

07015445

ABSTRACT:
The method for optimizing inspection speed during optical inspection of parts in high, low and fluorescent light applications. There are described autofocus mechanisms and methods optimized for fluorescent and non-fluorescent applications that when combined with a high speed CCD camera and high numerical aperture (NA) optics, achieve superior signal to noise ratio, resolution, and inspection speed performance.

REFERENCES:
patent: 5672885 (1997-09-01), Allen et al.
patent: 6324298 (2001-11-01), O'Dell et al.
patent: 6674058 (2004-01-01), Miller
patent: 2002/0036769 (2002-03-01), Shimada et al.
patent: 2003/0053676 (2003-03-01), Shimoda et al.
patent: 2003/0164440 (2003-09-01), Czarnelzki et al.

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