Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-03-14
2006-03-14
Wu, Jingge (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S151000, C382S291000, C382S296000, C382S294000
Reexamination Certificate
active
07013039
ABSTRACT:
An image processing of an object to be detected in bonding system for manufacturing, for instance, semiconductor devices including a step of calculation of a difference value between a reference image inputted beforehand and a rotated image obtained by rotating the reference image for a plurality of reference points within the reference image, a step of mask pattern production based upon the difference values for the plurality of reference points, and a step of position detection for a position of an object of detection by pattern matching by way of using an image of the object of detection obtained by imaging the object of detection, the reference image and the mask pattern.
REFERENCES:
patent: 5754679 (1998-05-01), Koljonen et al.
patent: 6185343 (2001-02-01), Ikeda et al.
patent: 6917699 (2005-07-01), Sugawara
patent: H2-148180 (1990-06-01), None
patent: H7-21377 (1995-01-01), None
patent: H9-102039 (1997-04-01), None
Kabushiki Kaisha Shinkawa
Koda & Androlia
Kuhn Jordan
Wu Jingge
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