Semiconductor devices and manufacturing method therefor and...

Registers – Records – Conductive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C340S572700, C343S7000MS

Reexamination Certificate

active

07036741

ABSTRACT:
In a wireless IC tag utilizing a wireless IC chip, the wireless IC tag having sufficient stress strength is manufactured economically. There is adopted a structure in which an upper electrode and a lower electrode are respectively formed on a front surface and a rear surface of a wireless IC chip, and the upper electrode is connected to a first conductor and a lower electrode is connected to a second conductor, and the first conductor and the second conductor are connected outside the wireless IC chip. Thereby, it is possible to fabricate the wireless IC tag economically and to ensure the stress strength.

REFERENCES:
patent: 5027107 (1991-06-01), Matsuno et al.
patent: 5781159 (1998-07-01), Desargant
patent: 5786626 (1998-07-01), Brady et al.
patent: 6504507 (2003-01-01), Geeraert
patent: 6657432 (2003-12-01), Morrone
patent: 6795025 (2004-09-01), Saito
patent: 6836248 (2004-12-01), Fukushima et al.
patent: 6900536 (2005-05-01), Derbenwick et al.
patent: 6930401 (2005-08-01), Usami
patent: 2005/0093677 (2005-05-01), Forster et al.
patent: 2005/0134460 (2005-06-01), Usami
patent: 4-119645 (1992-04-01), None
patent: 10-13296 (1998-01-01), None
patent: 2000-76406 (2000-03-01), None
patent: 2000-132653 (2000-05-01), None
patent: 2001-94031 (2001-04-01), None
patent: 2002-366917 (2002-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor devices and manufacturing method therefor and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor devices and manufacturing method therefor and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor devices and manufacturing method therefor and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568251

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.