Method and measuring device for locating enclosed objects

Details Method and measuring device for locating enclosed objects Method and measuring device for locating enclosed objects

2006-05-30

2006-05-30

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Conductor identification or location

Inaccessible

Reexamination Certificate

active

07053599

ABSTRACT:
A method for locating objects enclosed in a medium, according to which a detection signal is generated by at least one capacitive sensor device, the detection signal penetrating the medium that is to be analyzed in such a way that information is obtained about the objects that are enclosed in the medium by evaluating the detection signal, particularly by measuring impedance, wherein, in order to obtain information about the depth of an object that is enclosed in the medium, a phase measurement of a variable which is correlated with a shift current of the capacitive sensor device is utilized.

REFERENCES:
patent: 5012683 (1991-05-01), Davis
patent: 6198271 (2001-03-01), Heger et al.
patent: 6211662 (2001-04-01), Bijawat et al.
patent: 6249113 (2001-06-01), Krantz et al.
patent: 6838887 (2005-01-01), Denen et al.
patent: 2003/0021078 (2003-01-01), van Berkel
patent: 0 438 159 (1991-07-01), None
patent: 563 494 (1977-06-01), None
patent: 94 04932 (1994-03-01), None
patent: 98 30921 (1998-07-01), None

Affiliated with

Also associated with

Rating

Method and measuring device for locating enclosed objects does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and measuring device for locating enclosed objects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and measuring device for locating enclosed objects will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3551769