Extraction of interconnect parasitics

Details Extraction of interconnect parasitics Extraction of interconnect parasitics

2006-07-04

2006-07-04

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S076540, C331S140000

Reexamination Certificate

active

07071710

ABSTRACT:
The apparatus for detecting the effects of interconnect resistance and capacitance (RC) in a logic circuit includes a first ring oscillator with the interconnect RC parasitics in a logic circuit and a minimum reference ring oscillator without the interconnect RC parasitic in a logic circuit multiplexed to have common stages to obtain delay with and without the parasitics of the interconnect RC. The frequency difference between the first ring oscillator frequency and the minimum reference ring oscillator frequency is determined to detect the effects of the interconnect RC in the logic circuit.

REFERENCES:
patent: 5811983 (1998-09-01), Lundberg
patent: 6463570 (2002-10-01), Dunn et al.
patent: 2002/0120898 (2002-08-01), Chen et al.

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