Method, system, and computer program product for outlier...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C705S004000, C707S793000

Reexamination Certificate

active

07050932

ABSTRACT:
A random sampling of a subset of a data population is taken and the sampled data is used to build a predictive model using a cubic or multiquadric radial basis function, and then “scores” (i.e., predictions) are generated for each data point in the entire data population. This process is repeated on additional random sample subsets of the same data population. After a predetermined number of random sample subsets have been modeled and scores for all data points in the population are generated for each of the models, the average score and variation for each predicted data point is calculated. The data points are subjected to rank ordering by their variance, thereby allowing those data points having a high variance to be identified as outliers.

REFERENCES:
patent: 5445020 (1995-08-01), Rosensweig
patent: 5790645 (1998-08-01), Fawcett et al.
patent: 5832482 (1998-11-01), Yu et al.
patent: 5861891 (1999-01-01), Becker
patent: 5884305 (1999-03-01), Kleinberg et al.
patent: 6003029 (1999-12-01), Agrawal et al.
patent: 6012058 (2000-01-01), Fayyad et al.
patent: 6034697 (2000-03-01), Becker
patent: 6308175 (2001-10-01), Lang et al.
patent: 6629095 (2003-09-01), Wagstaff et al.
patent: 6633882 (2003-10-01), Fayyad et al.
patent: 6636860 (2003-10-01), Vishnubhotla
patent: 2002/0198889 (2002-12-01), Vishnubhotla
patent: 2003/0101080 (2003-05-01), Zizzamia et al.
patent: 2003/0144746 (2003-07-01), Hsiung et al.
patent: 2003/0145000 (2003-07-01), Arning et al.
patent: 2003/0154044 (2003-08-01), Lundstedt et al.
patent: 2003/0159106 (2003-08-01), Aono et al.
patent: 2003/0226100 (2003-12-01), Farahat et al.
patent: 2004/0010505 (2004-01-01), Vishnubhotla
patent: WO 99/62007 (1999-12-01), None
Ramaswamy et al., “Efficient Algorithms for Mining Outliers from Large Data Sets,” Bell Laboratories, Murray Hill, NJ, pp. 1-20, publication date unknown.
Ng, R., “CASCON '98 Workshop Report Detecting Outliers in Large Data Sets,” IBM Technical Report: TR-74.165-m, pp. 1-5 (Apr. 1999).
“Neural Data Mining for Credit Card Fraud Detection,”Proceedings 11 Intl. Conf. on Tools with Artificial Intelligence,pp. 103-106 (1999).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method, system, and computer program product for outlier... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method, system, and computer program product for outlier..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method, system, and computer program product for outlier... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3544450

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.