Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2006-05-02
2006-05-02
Chen, Kin-Chan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S692000, C216S089000
Reexamination Certificate
active
07037839
ABSTRACT:
A method for polishing an organic film, comprising polishing an exposed organic film provided on a semiconductor substrate by use of slurry containing resin particles.
REFERENCES:
patent: 6235636 (2001-05-01), Ng et al.
patent: 6375545 (2002-04-01), Yano et al.
patent: 6416685 (2002-07-01), Zhang et al.
patent: 6620215 (2003-09-01), Li et al.
patent: 6641632 (2003-11-01), Ronay
patent: 6736992 (2004-05-01), Zhang et al.
patent: 6740590 (2004-05-01), Yano et al.
patent: 2-51951 (1990-11-01), None
patent: 07-086216 (1995-03-01), None
patent: 11-87307 (1999-03-01), None
patent: 2001-277105 (2001-10-01), None
Notification for filing Opinion (Office Action) for Korean Patent Application No. 10-2003-0068158, mailed Aug. 31, 2005 and English translation thereof.
Murakami Satoshi
Takayasu Jun
Chen Kin-Chan
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
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