Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-26
2006-09-26
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S1540PB
Reexamination Certificate
active
07112987
ABSTRACT:
The semiconductor sensor has at least one field-effect transistor (31; 31, 32) which is coupled to a sensitive electrode and which has measuring phases that are interruptible by idle phases through a control device (50). During the idle phases, the field-effect transistor or transistors (30; 31, 32) together with their terminals is or are connected to the same potential, preferably the ground potential.
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Micronas GmbH
O'Shea Getz & Kosakowski P.C.
Tang Minh N.
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