System for compensating for dark current in sensors

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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Details

C348S241000, C250S208100, C355S053000, C430S005000

Reexamination Certificate

active

07081610

ABSTRACT:
A method is used to perform dark current compensation in a sensor (e.g., a CCD or CMOS sensor). A first and second array of devices (e.g., pixels) in the sensor are used to determine a first dark current value. The first array of pixels in the sensor receives impinging light and generates optical energy values therefrom. The second array of pixels in the sensor are used to determine a second dark current value at substantially a same time as the generating of the optical energy values. The second array of devices being non-sensitive to the impinging light. The first and second dark current values are used to compensate the optical energy values.

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English abstract for JP57042275, 1 page, provided by esp@cenet database.
JLW, 20 pages, (no date available).
CCD57-10 High Performance CCD Sensor, e2v Technologies Limited, 12 pages (Apr. 2003).
CCD77-00 Black Illuminated High Performance IMO Device, Marconi Applied Technologies Limited, 12 pages (Jan. 2002).
CCD Primer MTD/PS-0218 Charge-Coupled Device (CCD) Image Sensors, Eastman Kodak Company, 13 pages (May 29, 2001).

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