Process for forming pattern and method for producing liquid...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S660000, C438S706000, C438S717000

Reexamination Certificate

active

07033951

ABSTRACT:
A process for forming a pattern contains steps of: forming a first mask pattern on a film to be etched on a substrate; forming a first pattern of the film to be etched by using the first mask pattern as a mask; forming a second mask pattern having a plane shape different from that of the first mask pattern by deforming the first mask pattern; and forming a second pattern of the film to be etched different from the first pattern by using the second mask pattern. By applying the process for forming a pattern, for example, to the formation of a semiconductor layer and source and drain electrodes of a TFT substrate of a liquid crystal display apparatus, the above-stated formation requiring two photoresist process steps in a conventional manufacturing method of a liquid crystal display apparatus can be carried out by only one process step, thereby reducing manufacturing cost thereof.

REFERENCES:
patent: 5320932 (1994-06-01), Haraguchi et al.
patent: 5618384 (1997-04-01), Chan et al.
patent: 5670801 (1997-09-01), Nakano
patent: 6331443 (2001-12-01), Lee et al.

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