Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Reexamination Certificate
2006-09-26
2006-09-26
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
C438S977000
Reexamination Certificate
active
07112514
ABSTRACT:
An SOI (Silicon On Insulator) substrate is provided with: a support substrate (201); a single crystal silicon layer (202) disposed above one surface of the support substrate; an insulation portion (205) disposed between the support substrate and the single crystal silicon layer, the insulation portion comprising a single layer of an insulation film or a lamination structure of a plurality of insulation films, and including a silicon nitride film or a silicon nitride oxide film (204).
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patent: 5905553 (1999-05-01), Matsukawa et al.
patent: 6326642 (2001-12-01), Yamazaki et al.
patent: 6614479 (2003-09-01), Fukusho et al.
Chaudhari Chandra
Oliff & Berridge, plc
Seiko Epson Corporation
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