Optical encoders for position measurements

Details Optical encoders for position measurements Optical encoders for position measurements

2006-05-16

2006-05-16

Epps, Georgia (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

C250S231160, C250S231170

Reexamination Certificate

active

07045769

ABSTRACT:
Systems and methods are disclosed for providing position measurement information. For example, in accordance with one embodiment of the present invention, a multiple-pitch grating is employed to receive one or more laser beams and provide an output laser beam encoded with position information of the grating.

REFERENCES:
patent: 4710026 (1987-12-01), Magome et al.
patent: 5489986 (1996-02-01), Magome et al.
patent: 5654540 (1997-08-01), Stanton et al.
“Interferometric Encoder Techniques”, by R. J. Tansey et al., Jan. 8, 1988, pp. 1-52.
“An Absolute Distance Interferometer Using A Dye Laser Heterodyne Interferometer And Spatial Separation Of Beams”, Proceedings of SPIE—The International Society for Optical Engineering, vol. 429, Precision Surface Metrology, R. J. Tansey, Aug. 23-24, 1983, pp. 43-54.
U.S. patent application, entitled “Heterodyne Lateral Grating Interferometric Encoder”, given U.S. Appl. No. 10/394,930, filed on Mar. 19, 2003.

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