Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Reexamination Certificate
2006-07-18
2006-07-18
Le, Que T. (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
C250S239000
Reexamination Certificate
active
07078671
ABSTRACT:
An optical microbench configured to facilitate wafer-level testing of optoelectronic devices is provided. The optical microbench includes an optoelectronic device mounted to a wafer in which the optical microbench is provided. The optical microbench also includes a beam deflector provided in the wafer and disposed along the optical path of the optoelectronic device. The beam deflector is configured to deflect a portion of the optical path to lie along a direction oriented out of the plane of the wafer. The optical microbench further includes an optical feed-through disposed along the optical path between the optoelectronic device and the beam deflector. The optical feed-through is configured to conduct an optical signal between the beam deflector and the optoelectronic device. A method for testing optoelectronic devices at the wafer level is also provided.
REFERENCES:
patent: 4495400 (1985-01-01), Thompson
patent: 4807238 (1989-02-01), Yokomori
patent: 4897711 (1990-01-01), Blonder et al.
patent: 5071213 (1991-12-01), Chan
patent: 5163113 (1992-11-01), Melman
patent: 5263111 (1993-11-01), Nurse et al.
patent: 5327443 (1994-07-01), Tanaka et al.
patent: 5344746 (1994-09-01), Vettiger et al.
patent: 5384872 (1995-01-01), Jacobs-Cook et al.
patent: 5479426 (1995-12-01), Nakanishi et al.
patent: 5479540 (1995-12-01), Boudreau et al.
patent: 5500540 (1996-03-01), Jewell et al.
patent: 5563901 (1996-10-01), Otoma et al.
patent: 5696862 (1997-12-01), Hauer et al.
patent: 5898803 (1999-04-01), Mueller-Fiedler et al.
patent: 5912872 (1999-06-01), Feldman et al.
patent: 6062741 (2000-05-01), Tachigori
patent: 6081638 (2000-06-01), Zhou
patent: 6389202 (2002-05-01), Delpiano et al.
patent: 6495382 (2002-12-01), Yap
patent: 6746782 (2004-06-01), Zhao et al.
patent: 2002/0105979 (2002-08-01), Cappuzzo
patent: 0 609 062 (1994-08-01), None
patent: 2 312 551 (1997-10-01), None
Baskin Jonathan D.
Le Que T.
Shipley Company L.L.C.
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