Photothermal imaging scanning microscopy

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C356S432000

Reexamination Certificate

active

07075058

ABSTRACT:
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.

REFERENCES:
patent: 4521118 (1985-06-01), Rosencwaig
patent: 4634290 (1987-01-01), Rosencwaig et al.
patent: 4854710 (1989-08-01), Opsal et al.
patent: 5074669 (1991-12-01), Opsal
patent: 5574562 (1996-11-01), Fishman et al.
patent: 6081127 (2000-06-01), Wagner et al.
Chow, R., et al., “Absorptance behavior of optical coatings for high-average-power laser applications,” Applied Optics, vol. 39, No. 4, Feb. 1, 2000, pp. 650-658.
Chow, R., et al., “Absorptance Measurements of Transmissive Optical Components by the Surface Thermal Lensing Technique,” LLNL, UCRL-JC-128008, Sep. 24, 1997, 11 pages.
Wu, Z, et al., “Damage threshold prediction of hafnia-silica multiplayer coatings by nondestructive evaluation of fluence-limiting defects,” Applied Optics, vol. 40, No. 12, Apr. 20, 2001, pp. 1897-1906.
Wu, Z., et al., “Non-destructive evaluation of thin film coatings using a laser-induced surface thermal lensing effect,” Elsevier Science S.A., Thin Solid Films 290-291 (1996) pp. 271-277.
Wu, Z., et al., “Overview of photothermal characterization of optical thin film coatings,” SPIE, vol. 2714, pp. 465-479.
Jackson, W.B., et al., “Photothermal deflection spectroscopy and detection,” Applied Optics, vol. 20, No. 8, Apr. 15, 1981, pp. 1333-1344.
Boyer, D., et al., “Photothermal Imaging of Nanometer-Sized Metal Particles Among Scatterers,” Science, vol. 297, Aug. 16, 2002, pp. 1160-1163.
Han, Y., et al., “Pulsed photothermal deflection and diffraction effects: numerical modeling based on Fresnel diffraction theory,” Opt. Eng., 38(12) (Dec. 1999) pp. 2122-2128.

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