Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2006-03-14
2006-03-14
Korzuch, William (Department: 2653)
Metal working
Method of mechanical manufacture
Electrical device making
C029S603150, C029S603070, C360S324110, C360S324120
Reexamination Certificate
active
07010848
ABSTRACT:
A patterned, synthetic, longitudinally exchange biased GMR sensor is provided which has a narrow effective trackwidth and reduced side reading. The advantageous properties of the sensor are obtained by satisfying a novel relationship between the magnetizations (M) of the ferromagnetic free layer (F1) and the ferromagnetic biasing layer (F2) which enables the optimal thicknesses of those layers to be determined for a wide range of ferromagnetic materials and exchange coupling materials. The relationship to be satisfied is MF2/MF1=(Js+Jex)/Js, where Jsis the synthetic coupling energy between F1and F2and Jexis the exchange energy between F2and an overlaying antiferromagnetic pinning layer. An alternative embodiment omits the overlaying antiferromagnetic pinning layer which causes the relationship to become MF2/MF1=1.
REFERENCES:
patent: 5583725 (1996-12-01), Coffey et al.
patent: 5920446 (1999-07-01), Gill
patent: 6118624 (2000-09-01), Fukuzawa et al.
patent: 6222707 (2001-04-01), Huai et al.
patent: 6295186 (2001-09-01), Hasegawa et al.
patent: 6322640 (2001-11-01), Xiao et al.
patent: 6324037 (2001-11-01), Zhu et al.
patent: 6473279 (2002-10-01), Smith et al.
Ju Kochan
Li Min
Liao Simon
Zheng You Feng
Ackerman Stephen B.
Headway Technologies Inc.
Magee Christopher R.
Saile George D.
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