Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-01-10
2006-01-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S125000, C324S076210, C324S076550, C324S076740, C361S078000
Reexamination Certificate
active
06985824
ABSTRACT:
A frequency measuring device can measure the frequency of a noisy power system at high speed. The system voltage is measured at timings obtained by equally dividing one reference-wave period. Voltage vectors are calculated which have tip ends, each voltage vector consisting of a real part of a first measured voltage and an imaginary part of another voltage measured at timing 90 degrees before the first measured voltage. The length of a chord connecting tip ends of adjacent voltage vectors is calculated. A voltage root-mean-square value is calculated from voltages measured between two timings spaced from each other by the one reference-wave period. Chord lengths obtained between two timings spaced from each other by the one reference-wave period are summed. Based on the total of the chord lengths and the voltage root-mean-square value, there is calculated a phase angle between two adjacent voltage vectors, from which the system frequency is calculated.
REFERENCES:
patent: 4135243 (1979-01-01), Peregrino et al.
patent: 4319329 (1982-03-01), Girgis et al.
patent: 4715000 (1987-12-01), Premerlani
patent: 9-166630 (1997-06-01), None
Barlow John
Leydig , Voit & Mayer, Ltd.
TMT & D Corporation
Vo Hien
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