Test method and test apparatus for semiconductor device

Details Test method and test apparatus for semiconductor device Test method and test apparatus for semiconductor device

2006-01-31

2006-01-31

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06992499

ABSTRACT:
A method for testing a semiconductor device, is disclosed, which comprises detecting a defect in a semiconductor wafer having a plurality of chips on each of which a plurality of semiconductor elements are formed, to detect those of the chips which have a defect, and carrying out a fist electrical characteristics test to a first chip without defect, and a second electrical characteristics test which is more detailed than the first electrical characteristics test to a second chip having the defect.

REFERENCES:
patent: 5793650 (1998-08-01), Mirza
patent: 6259267 (2001-07-01), Fujiwara
patent: 6553323 (2003-04-01), Obara et al.
patent: 6657453 (2003-12-01), Frankowsky
patent: 10-313026 (1998-11-01), None
patent: 2001-318151 (2001-11-01), None
patent: 2002-26102 (2002-01-01), None
patent: WO 98/33213 (1998-07-01), None

Affiliated with

Also associated with

Rating

Test method and test apparatus for semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test method and test apparatus for semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test method and test apparatus for semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3531914