Semiconductor tester

Details Semiconductor tester Semiconductor tester

2006-03-14

2006-03-14

Smith, Zandra V. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07012444

ABSTRACT:
A semiconductor tester comprising a driver circuit for generating a predetermined driver waveform without using a coil device. The driver circuit provided in a pin electronics receives a waveform-shaped signal to be supplied to an IC pin of a device under test (DUT) and converts the amplitude to an amplitude of predetermined level. The driver output pulse outputted from the output terminal of the driver and having the converted amplitude to the IC pin of the DUT. The tester has pulse compensating means for compensating the individual waveforms of the rising and falling edges of the driver output pulse in a predetermined way.

REFERENCES:
patent: 5842155 (1998-11-01), Bryson et al.
patent: 6642707 (2003-11-01), Iorga et al.
patent: 4-189051 (1992-07-01), None
patent: 8-242151 (1996-09-01), None
Patent Abstracts of Japan, Publication No. 08-242151 dated Sep. 17, 1996, 1 pg.
Patent Abstracts of Japan, Publication No. 04-189051 dated Jul. 7, 1992, 1 pg.
International Search Report issued in International application No. PCT/JP02/12123, mailed on Mar. 4, 2003, 2 pgs.

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