X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1988-08-26
1992-08-11
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 54, 378 59, G01B 1502
Patent
active
051386445
ABSTRACT:
A method and apparatus for measuring the wall thickness of insulated pipe of various sizes, shapes and locations without requiring removal of the insulation. The apparatus includes a source which emits a collimated beam of low-level radiation and a detector adapted to detect the beam. The source and detector are pivotally mounted on trucks which in turn are movably mounted on frame assemblies which include rotatable shafts. Stepping motors are mounted on the frame assemblies and are drivingly connected to the shafts for rotating the shafts. Indexer devices are connected to a computer and to the motors for controlling the rotation of the shafts. Motion translators are mounted on the trucks and are operatively connected to the shafts for translating the rotational motion of the shafts into linear motion. The source and detector are located in aligned, opposed spaced relationship adjacent to the pipe. The stepping motors simultaneously linearly move the trucks, and the source and detector mounted thereon, in discrete linear steps along the shafts for scanning the pipe to take discrete measurements of the pipe wall thickness. The radiation beam emitted by the source passes through the insulated pipe and is detected by the aligned detector at each discrete step. A single channel analyzer device connected to the detector measures counts of unattenuated radiation beams detected by the detector. A computer is connected to the single channel analyzer through an interface and generates computer profiles of the pipe wall thickness.
REFERENCES:
patent: 2859349 (1958-11-01), Bradley et al.
patent: 3080479 (1963-03-01), Berg et al.
patent: 3278747 (1966-10-01), Ohmart
patent: 3474160 (1969-10-01), Doering
patent: 3489901 (1970-01-01), Brown
patent: 3808437 (1974-04-01), Miyagawa et al.
patent: 4088886 (1978-05-01), Moulton
patent: 4182954 (1980-01-01), Giles
patent: 4542297 (1985-09-01), Hold
patent: 4695729 (1987-09-01), Monno et al.
Krieger Richard L.
Magno Alan C.
McArdle Joseph G.
Glitsch Field Services/NDE, Inc.
Porta David P.
LandOfFree
Method and apparatus for measuring the wall thickness of insulat does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring the wall thickness of insulat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring the wall thickness of insulat will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-352819