Method and apparatus for detecting exposure of a...

Details Method and apparatus for detecting exposure of a... Method and apparatus for detecting exposure of a...

2005-11-29

2005-11-29

Ho, Hoai (Department: 2827)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185040

Reexamination Certificate

active

06970386

ABSTRACT:
A method and apparatus are disclosed for detecting if a semiconductor circuit has been exposed to ultra-violet light. An ultra-violet light detection circuit detects exposure to ultra-violet light and will automatically activate a security violation signal. The security violation signal may optionally initiate a routine to clear sensitive data from memory or prevent the semiconductor circuit from further operation. The ultra-violet light detection circuit detects whether a semiconductor circuit has been exposed to ultra-violet light, for example, by employing a dedicated mini-array of non-volatile memory cells. At least two active bit lines, blprg and bler, are employed corresponding to program and erase, respectively. One of the bit lines is only programmable and the other bit line is only eraseable. Generally, all of the bits in the dedicated non-volatile memory array are initially in approximately the same state, which could be erased, programmed or somewhere in between. An offset current is added to one bit line and a change in the resulting current difference is used to detect an exposure to ultra-violet light.

REFERENCES:
patent: 5598004 (1997-01-01), Powell et al.
patent: 2002/0036879 (2002-03-01), Vacherand et al.
PCT Search Report corresponding to the related PCT Patent Application No. US04/06202 mailed on Jul. 21, 2005.
PCT Written Opinion corresponding to the related PCT Patent Application No. US04/06202 mailed on Jul. 21, 2005.

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