Method for spectral analysis, and scanning microscope

Details Method for spectral analysis, and scanning microscope Method for spectral analysis, and scanning microscope

2005-12-20

2005-12-20

Evans, F. L. (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

C356S308000, C356S326000, C250S458100

Reexamination Certificate

active

06977724

ABSTRACT:
A method for spectral analysis of the light proceeding from a specimen using a multi-band detector comprises the steps of defining an overall spectral region; from the overall spectral region, defining a first spectral subregion and defining at least a second spectral subregion; simultaneously detecting the light proceeding from the specimen in the first and the second spectral subregion, and generating detection values; displacing the first spectral subregion and displacing the second spectral subregion within the overall spectral region; and repeating steps c) and d) until the light has been detected over the entire overall spectral region.

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patent: 2001/0046046 (2001-11-01), Schoeppe
patent: 2002/0021440 (2002-02-01), Knebel
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