Solid-state imaging device with the elimination of thermal...

Television – Camera – system and detail – Solid-state image sensor

Reexamination Certificate

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C348S300000

Reexamination Certificate

active

06975356

ABSTRACT:
A solid-state imaging device comprises: a plurality of pixels including a light-sensitive portion (2) for photoelectrically converting incident light, a transfer gate (10) for transferring a charge stored in the light-sensitive portion, a resettable detection capacitor (18) for storing the charge transferred from the transfer gate, and a selection switch (26) for outputting a charge of the detection capacitor according to a selection signal RWn; a charge amplifier (41) for converting the detection capacitor charge, which is outputted from the pixels, to a voltage; and a correlated double sampling circuit (86) for obtaining a voltage difference between a reset level and a detected level converted by the charge amplifier. According to the above device, a thermal noise is eliminated due to the correlated double sampling circuit. Further, a fixed pattern noise is not generated due to the pixel circuit structure.

REFERENCES:
patent: 5512750 (1996-04-01), Yanka et al.
patent: 5665959 (1997-09-01), Fossum et al.
patent: 5900623 (1999-05-01), Tsang et al.
patent: 6369853 (2002-04-01), Merrill et al.
patent: 6512544 (2003-01-01), Merrill et al.
patent: 6636261 (2003-10-01), Pritchard et al.
patent: 8-205034 (1996-08-01), None
Nishida Yasuaki, et al.“Noise in a CCD Image Sensor and the New Low-Nosie Read-Out Method”, Journal of the Institute of Television Engineers of Japan, vol. 39, No. 12, p. 11176-1181, 1985.
Eric R. Fossum, “CMOS Image Sensors: Electronic Camera on a Chip”, IEDM 95, pp. 17-25.

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