Electron beam exposure apparatus

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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Details

C250S492200, C250S492220, C250S492100, C250S492300

Reexamination Certificate

active

06911661

ABSTRACT:
An electron beam exposure apparatus, which exposes patterns on a wafer by an electron beam, includes an electron beam producing unit which produces the electron beam and an electron beam shaping member having a plurality of openings which shape the electron beam. The 1st ratio, which is a ratio between opening width of the 1st opening among the plurality of the openings in the 1st direction, which is substantially perpendicular to irradiation direction of the electron beam, and pattern width of the pattern, which should be exposed on the wafer by the electron beam shaped by the 1st opening, in the direction corresponding to the 1st direction, and the 2nd ratio, which is a ratio between opening width of the 2nd opening among the plurality of the openings, in the 1st direction, and pattern width of the pattern, which should be exposed on the wafer by the electron beam shaped by the 2nd opening, in the direction corresponding to the 1st direction, are different.

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patent: 9-266153 (1997-10-01), None

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