Emission layer formed by rapid thermal formation process

Semiconductor device manufacturing: process – Electron emitter manufacture

Reexamination Certificate

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Details

C257S009000, C257S010000, C438S022000

Reexamination Certificate

active

06852554

ABSTRACT:
An emitter has a rapid thermal process (RTP) formed emission layer of SiO2, SiOxNyor combinations thereof. The emission layer formed by rapid thermal processing does not require electroforming to stabilize the film. The RTP grown films are stable and exhibit uniform characteristics from device to device.

REFERENCES:
patent: 4923421 (1990-05-01), Brodie et al.
patent: 5142184 (1992-08-01), Kane
patent: 5374844 (1994-12-01), Moyer
patent: 5507676 (1996-04-01), Taylor et al.
patent: 5528103 (1996-06-01), Spindt et al.
patent: 5557596 (1996-09-01), Gibson et al.
patent: 5559342 (1996-09-01), Tsukamoto et al.
patent: 5760417 (1998-06-01), Watanabe et al.
patent: 6011356 (2000-01-01), Janning et al.
patent: 6023124 (2000-02-01), Chuman et al.
patent: 6033924 (2000-03-01), Pack et al.
patent: 6249080 (2001-06-01), Komoda et al.
patent: 6313043 (2001-11-01), Hattori
patent: 20020102799 (2002-08-01), Wawer et al.
patent: 20020177276 (2002-11-01), Su
patent: 20030141494 (2003-07-01), Govyadinov et al.
patent: 0913849 (1999-05-01), None
patent: 1003195 (2000-05-01), None
patent: 1094484 (2001-04-01), None
patent: 1267380 (2002-12-01), None
patent: 2000-76986 (2000-03-01), None
patent: WO0180273 (2001-10-01), None
patent: WO0235572 (2002-05-01), None
patent: WO02089166 (2002-11-01), None
patent: WO02089167 (2002-11-01), None
patent: WO02089168 (2002-11-01), None
patent: WO02103738 (2002-12-01), None
“A Decade Away: Atomic Resolution Storage,” Scientific American: Feature Article: Avoiding a Data Crunch: May 2000, http://www.sciam.com/2000/0500issue/0500toigbox6.html.

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