Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2005-08-02
2005-08-02
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S240000
Reexamination Certificate
active
06924156
ABSTRACT:
A ferroelectric capacitor device, such as an FeRAM device is formed by forming a substrate extending in a first plane and comprising a number of layers of material, forming a hard mask layer on the substrate and forming a first layer of a first material on the hard mask layer. The hard mask shape is then defined by etching the hard mask layer. A second layer of the first material is deposited on the etched hard mask layer. The deposited second layer has one or more side surfaces extending substantially perpendicular to the plane of the substrate. The second layer and the number of layers forming the substrate are then etched to shape the ferroelectric capacitor device.
REFERENCES:
patent: 5972722 (1999-10-01), Visokay et al.
patent: 6207496 (2001-03-01), Kang
patent: 6211034 (2001-04-01), Visokay et al.
patent: 6465321 (2002-10-01), Shin et al.
patent: 6762064 (2004-07-01), Zhuang et al.
patent: 6780708 (2004-08-01), Kinoshita et al.
patent: 2003/0082916 (2003-05-01), Chung et al.
patent: 2003/0119251 (2003-06-01), Aggarwal et al.
“Sputter-Resistant Mask Structure and Process”, IBM Technical Disclosure Bulletin, IBM Corp., New York, USA, 33(3B):379-381, Aug. 1990.
Egger Ulrich
Zhuang Haoren
Fish & Richardson P.C.
Infineon - Technologies AG
Nelms David
Nguyen Thinh T.
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