Semiconductor dynamic quantity sensor with movable electrode...

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element

Reexamination Certificate

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Reexamination Certificate

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06973829

ABSTRACT:
A semiconductor dynamic quantity sensor has a support substrate with a rectangular opening portion, and a movable electrode and fixed electrodes are respectively supported by the support substrate through supporting portions to face the opening portion. The supporting portions supporting the movable electrode are arranged in a direction approximately the same as that in which the supporting portions supporting the fixed electrodes are arranged.

REFERENCES:
patent: 5500549 (1996-03-01), Takeuchi et al.
patent: 5574222 (1996-11-01), Offenberg
patent: 6065341 (2000-05-01), Ishio et al.
patent: 6151966 (2000-11-01), Sakai et al.
patent: 6291875 (2001-09-01), Clark et al.
patent: 6450031 (2002-09-01), Sakai et al.
patent: A-7-131036 (1995-05-01), None
patent: A-8-15308 (1996-01-01), None
patent: A-11-304834 (1999-11-01), None
patent: A-2000-165952 (2000-06-01), None
U.S. Appl. No. 09/306,381, filed May 6, 1999, Muto et al.

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