System for collecting data used by surface profiling scheme

Details System for collecting data used by surface profiling scheme System for collecting data used by surface profiling scheme

2005-06-28

2005-06-28

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C033S523000, C073S105000, C702S167000

Reexamination Certificate

active

06912478

ABSTRACT:
A system is provided for the collection of measurements for use by a surface profiling processing scheme. A movable platform is equipped to: (i) generate a measurement of inclination of a surface when the platform is and stationary thereon, (ii) generate measurements of surface curvature as the platform traverses the surface, (iii) monitor distance that the platform traverses during a measurement run, (iv) generate a signal each time the platform traverses a predetermined amount of distance during a measurement run where the signal is such that the user is alerted to stop the platform, (v) collect measurements of curvature while the platform traverses the surface, and (vi) collect measurements of inclination at the starting position, stopping position, and each time the platform is stopped during the measurement run.

REFERENCES:
patent: 3056209 (1962-10-01), Oliver
patent: 4403419 (1983-09-01), Graves
patent: 5535143 (1996-07-01), Face

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