Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2005-06-07
2005-06-07
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S003000, C438S073000
Reexamination Certificate
active
06902940
ABSTRACT:
A magnetic memory element has reduced demagnetization coupling between a pinned layer and a free layer. The element includes a pinned ferromagnetic layer and a free ferromagnetic layer which are separated by a barrier layer. The pinned layer is pinned by an antiferromagnetic layer. An offset ferromagnetic layer is provided on a side of the antiferromagnetic layer opposite the pinned ferromagnetic layer to reduce demagnetization coupling between the free ferromagnetic layer and the pinned ferromagnetic layer.
REFERENCES:
patent: 5764567 (1998-06-01), Parkin
patent: 5862022 (1999-01-01), Noguchi et al.
patent: 6438026 (2002-08-01), Gillies et al.
patent: 6466419 (2002-10-01), Mao
patent: 6777730 (2004-08-01), Daughton et al.
patent: 2002/0030489 (2002-03-01), Lenssen et al.
patent: 2002/0141120 (2002-10-01), Gill
Dickstein , Shapiro, Morin & Oshinsky, LLP
Nelms David
Nguyen Thinh T
LandOfFree
Method for manufacture of MRAM memory elements does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for manufacture of MRAM memory elements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacture of MRAM memory elements will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3505766