Method for manufacture of MRAM memory elements

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component

Reexamination Certificate

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C438S003000, C438S073000

Reexamination Certificate

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06902940

ABSTRACT:
A magnetic memory element has reduced demagnetization coupling between a pinned layer and a free layer. The element includes a pinned ferromagnetic layer and a free ferromagnetic layer which are separated by a barrier layer. The pinned layer is pinned by an antiferromagnetic layer. An offset ferromagnetic layer is provided on a side of the antiferromagnetic layer opposite the pinned ferromagnetic layer to reduce demagnetization coupling between the free ferromagnetic layer and the pinned ferromagnetic layer.

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patent: 6438026 (2002-08-01), Gillies et al.
patent: 6466419 (2002-10-01), Mao
patent: 6777730 (2004-08-01), Daughton et al.
patent: 2002/0030489 (2002-03-01), Lenssen et al.
patent: 2002/0141120 (2002-10-01), Gill

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