Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
06909496
ABSTRACT:
A transmitting section makes light, intensity-modulated by a modulating signal of a sine wave having a designated frequency, be incident on one end side of an optical fiber which is a measurement object. A feature value determining section converts the light, which exits from another end side of the optical fiber, into an electric signal, and finds, from the electric signal, a predetermined feature value of a signal component having a frequency equal to the frequency of the modulating signal. A computing section obtains a nonlinear refractive index of the optical fiber to be measured from the predetermined feature value by calculation corresponding to the predetermined feature value based on a nonlinear Schroedinger (Schrödinger) equation.
REFERENCES:
patent: 5357333 (1994-10-01), DeBernardi et al.
patent: 5457576 (1995-10-01), Atkinson et al.
patent: 5661554 (1997-08-01), Calvani et al.
patent: 5742723 (1998-04-01), Onishi et al.
patent: 5774217 (1998-06-01), Lee et al.
patent: 6081632 (2000-06-01), Yoshimura et al.
patent: 6466721 (2002-10-01), Tsukitani et al.
patent: 0 548 935 (1993-06-01), None
patent: 0 745 837 (1996-12-01), None
patent: 8-285728 (1996-11-01), None
Y. Namihira et al; “Nonlinear Coefficient Measurements for Dispersion Shifted Fibres Using Self-Phase Modulation Method at 1.55μm”; Jul. 7, 1994; Electronics Letters vol. 30, No. 14, pp. 1171-1172.
L. Prigent et al; “Measurement of Fiber Nonlinear Kerr Coefficient by Four-Wave Mixing”; IEEE Photonics Technology Letters, vol. 5, No. 9, Sep. 1993; pp. 1092-1095.
Anritsu Corporation
Frishauf Holtz Goodman & Chick P.C.
Nguyen Tu T.
LandOfFree
Method and device for easily and rapidly measuring nonlinear... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for easily and rapidly measuring nonlinear..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for easily and rapidly measuring nonlinear... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3498956