Semiconductor device for detecting and adjusting a threshold...

Details Semiconductor device for detecting and adjusting a threshold... Semiconductor device for detecting and adjusting a threshold...

2005-11-15

2005-11-15

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S762010

Reexamination Certificate

active

06965247

ABSTRACT:
The present invention generally relates to a semiconductor device and more specifically to a semiconductor device for detecting and adjusting threshold voltage variations of an integrated semiconductor device implemented in sub-micron technology, i.e. transistors, and a method related thereto. To adjust the threshold voltage variation induced by the fabrication process in the semiconductor a comparison between a device under test and a fixed voltage value is provided. According to the invention, a constant current is injected in the transistor and the gate-to-source potential is fixed by a bias voltage. According to the comparison result, a well potential is provided to the semiconductor device to adjust the threshold voltage.

REFERENCES:
patent: 4789825 (1988-12-01), Carelli et al.
patent: 5565799 (1996-10-01), Houston
patent: 5648920 (1997-07-01), Duvvury et al.
patent: 5777518 (1998-07-01), Bailey
patent: 6275972 (2001-08-01), Long et al.
Walker et al., “A Parallel Measurement System for the Extraction of Level 3 Spice Parameters”, Proc. IEEE Int. Conf. On Microelectronic Test Structure, Edinburgh XP010000918, p. 135, left-hand col., lines 1-140. right-hand col. last line. Figure 1a. (Mar. 1990) .

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