Static information storage and retrieval – Floating gate – Disturbance control
Reexamination Certificate
2005-12-27
2005-12-27
Tran, Andrew Q. (Department: 2824)
Static information storage and retrieval
Floating gate
Disturbance control
C365S185270, C365S185180, C365S185170, C365S185190, C365S185260, C365S185280
Reexamination Certificate
active
06980471
ABSTRACT:
A programming technique for a flash memory causes electrons to be injected from the substrate into charge storage elements of the memory cells. The source and drain regions of memory cells along a common word line or other common control gate line being programmed by a voltage applied to the common line are caused to electrically float while the source and drain regions of memory cells not being programmed have voltages applied thereto. This programming technique is applied to large arrays of memory cells having either a NOR or a NAND architecture.
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Parsons Hsue & de Runtz LLP
SanDisk Corporation
Tran Andrew Q.
LandOfFree
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