Method and apparatus for wafer level testing of integrated...

Optical waveguides – With optical coupler – Particular coupling structure

Reexamination Certificate

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C385S014000

Reexamination Certificate

active

06859587

ABSTRACT:
A method of testing a planar lightwave circuit is achieved by coupling an optical probe to the planar lightwave circuit. In one embodiment, a second probe is used in combination with the first probe to test the planar lightwave circuit by sending and receiving a light beam through the planar lightwave circuit.

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Arun K. Agarwal, “Low-cost approach for testing fiber optic couples and splitters”, 2417 Optical Engineering; vol. 32, No. 12; Dec. 1993; pp. 3244-3248.

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