Optically scanning apparatus and defect inspection system

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S237200

Reexamination Certificate

active

06858859

ABSTRACT:
An optically scanning apparatus and defect inspection system able to detect a defect with a high resolution and able to greatly shorten the inspection time. An radiation beam generated from a light source is converted to a light beam array of an m×n matrix by a two-dimensional diffraction grating. The light beams of the light beam array are focused into micro spots by an objective lens and projected on a sample. Therefore, a two-dimensional light spot array of an m×n matrix is formed on a sample. The sample stage rotates and moves rectilinearly in an r direction, so the sample surface is scanned by the m×n matrix of light spots. As a result, the sample surface is spirally scanned by a light beam of a belt shape of the scan width, so can be scanned at a high speed. Further, the beams reflected by the sample surface are received by light receiving elements separated by light blocking members, so a confocal optical system is formed and as a result the resolution of detection of defects becomes much higher.

REFERENCES:
patent: 5774222 (1998-06-01), Maeda et al.
patent: 6043932 (2000-03-01), Kusunose
patent: 6208411 (2001-03-01), Vaez-Iravani
patent: 6433876 (2002-08-01), Kuhn
patent: A 11-199031 (1999-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optically scanning apparatus and defect inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optically scanning apparatus and defect inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optically scanning apparatus and defect inspection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3494800

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.