Method and device for near-field measuring of non-controlled...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C343S703000, C324S076110

Reexamination Certificate

active

06850851

ABSTRACT:
An electric field emitted by an electronic equipment is measured by producing at least one radiation measurement in the radiating field of the equipment. Several sets of simultaneous near-field measurements, within a measuring surface located at a short distance from the equipment, are performed. The sets of performed measurements are processed by estimating the statistical properties of the radiated field at any point outside the measuring surface.

REFERENCES:
patent: 5365241 (1994-11-01), Williams et al.
patent: 5432523 (1995-07-01), Simmers et al.
patent: 5485158 (1996-01-01), Mailloux et al.
patent: 5773974 (1998-06-01), Kraz
patent: 6191744 (2001-02-01), Snow et al.
patent: 6456070 (2002-09-01), Kazama et al.
patent: 6657596 (2003-12-01), Djuknic
Taaghol et al., “Near-Field to Near/Far-Field Transformation for Arbitrary Near-Field Geometry, Utilizing an Equivalent Magnetic Current”, IEEE, 1996.*
Fourestie et al., “Statistical Modal Analysis Applied to Near-Field Measurements of Random Emissions”, IEEE, 2002.*
Paker et al., “Application of Adaptive Algorithms for Near-Field Far-Field transformation”, IEEE, 1996.*
Laroussi et al., “Far-Field Predictions from Near-Field Measurements Using an Exact Integral Equvation Solution”, IEEE, 1994.*
Regue et al., “A Genetic Algorithm Based Method for Predicting Far-Field Radiated Emissions from Near-Field Measurements”, IEEE, 2000.*
Narasimhan et al., “An Efficient Technique for Spherical Near-Field to Far-Field Transformation and Evaluation of Far Fields of Perfectly Conducting Scatterers”, IEEE, 1989.*
“EMC-investigation of hand-held mobile telephones using a double-cone nearfield to farfield transformation” by H. Ruoss et al., XP000682639 EuMC, pp. 795-798, Sep. 1996.
“The UCLA Bi-Polar Planar-Near-Field Antenna-Measurement and Diagnostics Range” by Y. Rahmat et al., XP 000552175, pp. 16-35,IEEE Antennas&Propagation Magazine, vol. 37, No. 6, Dec. 1995.
Spherical Near-Field Facility for Microwave Coupling Assessments in the 100MHz-6GHz Frequency Range: by D. Serafin et al., XP002136104, pp. 225-234IEEE Transactions on Electromagnetic Compatibility, vol. 40, No. 3, Aug. 1998.
“3-D Electromagnetic Field Modeling Based on Near Field Measurements” by A. Roczniak et al., XP 000852501, pp. 1124-1127,IEEE Instrumentation and Measurement Technology Conference, Jun. 1996.
“Near-Field Characterization of PCBs For Radiated Emissions Prediction” by J. Lauren, Proceedings of the International Symposium on Electromagnetic Capability,IEEEXP000427692, pp. 322-326, Aug. 1993.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and device for near-field measuring of non-controlled... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for near-field measuring of non-controlled..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for near-field measuring of non-controlled... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3492196

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.