Single-probe charge measurement testing method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324158R, G01R 3102

Patent

active

051382660

ABSTRACT:
A test arrangement for printed wiring boards or the like employs a probe to contact the various nodes on the circuit board and charge or discharge these nodes. A reference plane of electrically conductive material is closely spaced from the board under test, and a charge-transfer detection or measurement arrangement is connected to this reference plane. The circuit board is mounted on an X-Y positioning mechanism while the test is being conducted, so the probe can be selectively applied to each of the conductive nodes of the circuit board. The charging of the nodes by capacitive coupling to the reference plane is measured and correlated with the probe position to provide an indication of circuit integrity. The measurements made on the board under test are compared with a reference data file of the X-Y coordinates of the nodes to determine whether or not there are discrepancies, and if so, the locations.

REFERENCES:
patent: 3796947 (1974-03-01), Harrod et al.
patent: 4001686 (1977-01-01), Radichel
patent: 4229693 (1980-10-01), Irick et al.
patent: 4565966 (1986-01-01), Burr et al.
patent: 4573008 (1986-02-01), Lischke
patent: 4583042 (1986-04-01), Riemer
Woodward et al., "Voltage Contrast Electron Beam Testing Experiments on Very Large Scale Integrated Circuit Chip Packaging Substrates", J. Vac. Sci. Tech., Nov./Dec. 1988, p. 1966.
Paul May et al., "Laser Pulsed E-Beam System for High-Speed I.C. Testing", Abstract No. 129, Extended Abstracts, The Electrochem. Soc., Spring Meet., May 10, 1987.
Weiner et al. "Picosecond Temporal Resolution Photoemissive Sampling", Applied Physics Letters, May 1987.
R. B. Marcus et al., "High-Speed Electrical Sampling by fs Photoemission", Applied Physics Letters, 11 Aug. 1986, p. 357.

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