Method for fabricating encapsulated semiconductor components

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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Details

C438S108000, C438S113000, C438S114000, C438S460000, C438S462000, C438S465000

Reexamination Certificate

active

06908784

ABSTRACT:
A semiconductor component includes a thinned semiconductor die having protective polymer layers on up to six surfaces. The component also includes contact bumps on the die embedded in a circuit side polymer layer, and terminal contacts on the contact bumps in a dense area array. A method for fabricating the component includes the steps of providing a substrate containing multiple dice, forming trenches on the substrate proximate to peripheral edges of the dice, and depositing a polymer material into the trenches. In addition, the method includes the steps of planarizing the back side of the substrate to contact the polymer filled trenches, and cutting through the polymer trenches to singulate the components from the substrate. Prior to the singulating step the components can be tested and burned-in while they remain on the substrate.

REFERENCES:
patent: 5138434 (1992-08-01), Wood et al.
patent: 5686317 (1997-11-01), Akram et al.
patent: 5851911 (1998-12-01), Farnworth
patent: 5863813 (1999-01-01), Dando
patent: 5888883 (1999-03-01), Sasaki et al.
patent: 5897337 (1999-04-01), Kata et al.
patent: 5904546 (1999-05-01), Wood et al.
patent: 6013948 (2000-01-01), Akram et al.
patent: 6051875 (2000-04-01), Dando
patent: 6060373 (2000-05-01), Saitoh
patent: 6074896 (2000-06-01), Dando
patent: 6080602 (2000-06-01), Tani et al.
patent: 6087845 (2000-07-01), Wood et al.
patent: 6107109 (2000-08-01), Akram et al.
patent: 6107164 (2000-08-01), Ohuchi
patent: 6114240 (2000-09-01), Akram et al.
patent: 6130111 (2000-10-01), Ikuina et al.
patent: 6136137 (2000-10-01), Farnworth et al.
patent: 6150717 (2000-11-01), Wood et al.
patent: 6153448 (2000-11-01), Takahashi et al.
patent: 6169329 (2001-01-01), Farnworth et al.
patent: 6177295 (2001-01-01), De Samber et al.
patent: 6180504 (2001-01-01), Farnworth et al.
patent: 6221751 (2001-04-01), Chen et al.
patent: 6233185 (2001-05-01), Beffa et al.
patent: 6281131 (2001-08-01), Gilton et al.
patent: 6294837 (2001-09-01), Akram et al.
patent: 6313531 (2001-11-01), Geusic et al.
patent: 6338980 (2002-01-01), Satoh
patent: 6350664 (2002-02-01), Haji et al.
patent: 6353267 (2002-03-01), Ohuchi et al.
patent: 6524890 (2003-02-01), Ueda et al.
patent: 6534387 (2003-03-01), Shinogi et al.
patent: 6579748 (2003-06-01), Okuno et al.
patent: 6607970 (2003-08-01), Wakabayashi
patent: 6649445 (2003-11-01), Qi et al.
patent: 10-79362 (1998-03-01), None
patent: 2000-31185 (2000-01-01), None
Advanced Coating Parylene Conformal Coating Specialists, advertising material, pp. 1-7, 1998, month unknown.
Dexter Electronic Materials, Hysol FP4451 Material Properties, spec sheet, pp. 1-2, Aug. 20, 1999.
Dexter Electronic Materials, Hysol FP4450 Material Properties, spec sheet, pp. 1-2, Aug. 20, 1999.
Parylene Coating, advertising for Specialty Coating Systems, pp. 1-2, date unknown.
Wafer Size CSP Packaging by VPES, Japan Rec Co., Ltd., advertising material, pp. 1-4, 1998.
U.S. patent application Ser. No. 09/259,142, Farnworth et al.
U.S. patent application Ser. No. 09/652,340, Farnworth.
David Francis & Linda Jardine, “Thin, Wafer-Level Package Is Made Without Damaging Die”, Chip Scale Review, May/Jun. 2002, p. 70.
Jeffrey C. Demmin, “More Wafer Thinning at ICAPS”, media news analysis, Mar. 13, 2002.

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