Mass analyzing method using an ion trap type mass spectrometer

Details Mass analyzing method using an ion trap type mass spectrometer Mass analyzing method using an ion trap type mass spectrometer

Filed on

2005-10-11

Date issued

2005-10-11

Examiner

Lee, John R. (Department: 2881)

Patent Class

Radiant energy

SubClass

Ionic separation or analysis

SubSubClass

Cyclically varying ion selecting field means

Other Related Categories

C250S281000, C250S282000, C250S283000, C250S290000, C250S291000, C250S292000

Type

Reexamination Certificate

Status

active

Patent number

06953929

Description

ABSTRACT:
The present invention provides a method of discriminating singly-charged ions from multiply-charged ions by the use of an ion trap type mass spectrometer which is an inexpensive mass spectrometer. This is achieved by a mass-analyzing method using an ion trap type mass spectrometer equipped with a ring electrode and one pair of end cap electrodes to temporarily trap ions in a three-dimensional quadrupole field to mass-analyze a sample. The method includes a first step of applying a main high frequency voltage to the ring electrode to form a three-dimensional quadrupole field, a second step of generating ions in the mass analyzing unit or injecting ions from the outside and trapping ions of a predetermined mass-to-charge ratio range in the mass analyzing unit, a third step of applying a supplementary AC voltage having a plurality of frequency components between the end cap electrodes and scanning the frequency components of the supplementary AC voltage, and a fourth step of scanning the main high frequency voltage and ejecting ions from the mass analyzing unit, and detection thereof. With this, chemical noises can be reduced dramatically.

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