Device for position indication and detection of guidance errors

Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer

Reexamination Certificate

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Details

C702S097000, C250S23700G, C356S139060, C356S617000, C341S011000

Reexamination Certificate

active

06907372

ABSTRACT:
A device for position indication and the detection of guidance errors that includes a scale that has a position measuring graduation arranged in a position measurement direction. A first guidance error measuring graduation which is arranged perpendicularly with respect to the position measurement graduation and a second guidance error measuring graduation which is arranged perpendicularly with respect to the position measurement graduation, wherein the first guidance error measuring graduation and the second guidance error measuring graduation are arranged on both sides of and adjacent to the position measuring graduation. A position indication scanning unit movable with respect to the scale, wherein the position indication scanning unit scans the position measuring graduation for generating position measurement signals. A guidance error scanning unit that is movable with respect to the scale, wherein the guidance error scanning unit scans the first guidance error measuring graduation for generating guidance error measurement signals.

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“Wichtige Begriffe der Mikropositionierung,” published by Physik Instrumente (PI), while the date of publication is unknown, it is believed that the article was published prior to Sep. 14, 2000, pp. 7.5-7.6.
Pending Patent Application Assigned to Dr. Johannes Heidenhain GmbH: Serial No.: 09/208,127, Filing Date: Dec. 9, 1998, Inventor: Mayer et al.
Pending Patent Application Assigned to Dr. Johannes Heidenhain GmbH: Serial No.: 09/485,358, Filing Date: Apr. 18, 2000, Inventor: Holzapfel et al.

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