Method for testing the reliability of a testing apparatus,...

Details Method for testing the reliability of a testing apparatus,... Method for testing the reliability of a testing apparatus,...

2005-06-28

2005-06-28

Bali, Vikkram (Department: 2623)

Image analysis

Applications

Manufacturing or product inspection

C348S127000

Reexamination Certificate

active

06912303

ABSTRACT:
To test the reliability of a testing apparatus which tests a large number of objects of the same type for one feature, generates a feature signal for each object and checks the feature signal for fulfilment of a first condition, a test object is conducted to the testing apparatus after a number of objects and the feature signal of the test object is checked for the fulfilment of a second condition. The second condition is that the feature signal of the test object corresponds to a previously entered reference value. The reference value can be entered by storing the feature signal of a test object as a reference value.

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Patent Abstracts of Japan vol. 14, No. 101 (P-1012), Feb. 23, 1990 & JP01305351 (Hitachi Ltd), Dec. 8, 1989.
A copy of international Search Report for PCT/EP97/06300.

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