Systems and methods for facilitating testing of pad...

Details Systems and methods for facilitating testing of pad... Systems and methods for facilitating testing of pad...

2005-06-14

2005-06-14

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C716S030000

Reexamination Certificate

active

06907376

ABSTRACT:
A preferred integrated circuit for facilitating receiver trip level testing functionality includes a first pad which incorporates a first driver and a first receiver. The first driver is configured to provide a first pad output signal to a component external to the IC. The first receiver is configured to receive a first pad input signal from a component external to the IC, and to provide a first receiver digital output signal to a component internal to the IC in response to the first pad input signal. Additionally, a first test circuit is provided that is arranged internal to the IC, with the first test circuit being adapted to provide information corresponding to at least one receiver trip-level characteristic of the first receiver of the first pad. Systems, methods and computer readable media also are provided.

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Haulin, Tord, “Built-in Parameric Test for Controlled Impedance I/Os,” Ericsson Telecom, S.126 25 Stockholm, Sweden, pp. 123-128.
Niggemeyer, M. Ruffer,, “Parametric Built-in Self Test of VLSI Systems,” Laboratory for Information Technology, University of Hannover, Germany.

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