Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-09
2005-08-09
Hollington, Jermele M. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06927590
ABSTRACT:
A voltage regulated power supply test circuit including: a voltage regulator electrically connected to at least one regulated voltage node of a functional circuit of an integrated circuit chip; and means for selectively connecting between one of the at least one regulated voltage nodes and ground with at least one load circuit adapted to put an emulated current load of the functional circuit on the regulated voltage supply.
REFERENCES:
patent: 4227185 (1980-10-01), Kronlage
patent: 4792749 (1988-12-01), Kitagawa et al.
patent: 5428299 (1995-06-01), Koshikawa
patent: 5566185 (1996-10-01), Hori et al.
patent: 5712859 (1998-01-01), Hori et al.
patent: 5943282 (1999-08-01), Iwata et al.
patent: 5955870 (1999-09-01), Nair
patent: 6081105 (2000-06-01), Nair
patent: 6084385 (2000-07-01), Nair
patent: 6504394 (2003-01-01), Ohlhoff
patent: 6833281 (2004-12-01), Gilliam
Henkler Richard A.
Hollington Jermele M.
Schmeiser Olsen & Watts
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