Statistical guardband methodology

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression

Reexamination Certificate

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C703S001000, C703S006000, C703S013000, C703S014000, C703S022000, C700S039000, C700S051000, C700S052000, C700S108000, C700S109000, C700S110000, C702S080000, C702S081000, C702S082000, C702S083000, C702S084000, C702S178000, C702S179000, C702S181000, C702S182000, C702S186000, C706S012000, C713S100000, C714S033000

Reexamination Certificate

active

06937965

ABSTRACT:
A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality against yield loss.

REFERENCES:
patent: 5634001 (1997-05-01), Mittl et al.
patent: 6226741 (2001-05-01), Shen et al.
patent: 6356861 (2002-03-01), Singhal et al.
Kreyszig, “Advanced Engineering Mathematics”, John Wiley & Sons, 1988, pp. 1248-1253.
Comard et al., “Calculating Error of Measurement on High Speed Microprocessor Test”, Proceedings of International Test Conference, Oct. 1994, pp. 793-801.
Richard H. Williams, Charles F. Hawkins The Effect of Guardbands on Errors in Production Testing Mar. 1993, pp. 2-7 ; 0-8186-3360—Mar. 1993 @ 1993 IEEE Electrical and Computer Engineering Dept. The University of New Mexico, Albuquerque, NM 87131.
Richard H. Williams, Chareles F. Hawkins The Economics of Guardband Placement Aug. 1993, pp. 218-225; 0-7803-1429-8/93 Internation Test Conference 1993 Electrical and Computer Engineering Dept. The University of New Mexico, Albuquerque, NM 87131.

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