Wavelength monitor

Optics: measuring and testing – By light interference

Reexamination Certificate

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Reexamination Certificate

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06980297

ABSTRACT:
A wavelength monitor10having a Michelson interferometer (or Mach-Zehnder) optical system11of a spatial light type having optical input from a light source has an interference pattern generating means12which inclines the wavefronts of interfering beams of collimated light to generate an interference pattern in the light intensity distribution in an interference light beam planes a first slit107and a second slit108which are adjustable in position and provided in front of a first photo-detector109and a second photo-detector, respectively, which receive split beams of interference light, and a signal processing means111by which the changes in the intensity of light from the first photo-detector109and the second photo-detector110are counted and subjected to necessary arithmetic operations to output signals representing wavelength data for the input light.

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patent: 6795188 (2004-09-01), Ruck et al.

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