Optics: measuring and testing – By light interference
Reexamination Certificate
2005-12-27
2005-12-27
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Reexamination Certificate
active
06980297
ABSTRACT:
A wavelength monitor10having a Michelson interferometer (or Mach-Zehnder) optical system11of a spatial light type having optical input from a light source has an interference pattern generating means12which inclines the wavefronts of interfering beams of collimated light to generate an interference pattern in the light intensity distribution in an interference light beam planes a first slit107and a second slit108which are adjustable in position and provided in front of a first photo-detector109and a second photo-detector, respectively, which receive split beams of interference light, and a signal processing means111by which the changes in the intensity of light from the first photo-detector109and the second photo-detector110are counted and subjected to necessary arithmetic operations to output signals representing wavelength data for the input light.
REFERENCES:
patent: 4280764 (1981-07-01), Sica et al.
patent: 4758090 (1988-07-01), Schuma
patent: 4832492 (1989-05-01), Calvani et al.
patent: 5574557 (1996-11-01), Bjork et al.
patent: 5684545 (1997-11-01), Dou et al.
patent: 5841536 (1998-11-01), Dimmick
patent: 6043883 (2000-03-01), Leckel et al.
patent: 6137573 (2000-10-01), Luke et al.
patent: 6587214 (2003-07-01), Munks
patent: 6621837 (2003-09-01), Le Gall et al.
patent: 6795188 (2004-09-01), Ruck et al.
Ando Electric Co. Ltd.
Lyons Michael A.
Turner Samuel A.
LandOfFree
Wavelength monitor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wavelength monitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavelength monitor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3481354