Method and apparatus for real time monitoring of metallic...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S700000

Reexamination Certificate

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06960921

ABSTRACT:
A method and apparatus for monitoring the concentration of metal cations in a chemical solution. In a preferred embodiment, the chemical solution is a solution for derouging or passivating stainless steel. A capacitive sensor provides data indicative of the concentration of chemical components (e.g., iron or chromium) in the chemical solution.

REFERENCES:
patent: 3636444 (1972-01-01), Strawn et al.
patent: 3778706 (1973-12-01), Thompson
patent: 3816811 (1974-06-01), Cmelik
patent: 4031742 (1977-06-01), Michael et al.
patent: 4158810 (1979-06-01), Leskovar
patent: 4219776 (1980-08-01), Arulanandan
patent: 4427772 (1984-01-01), Kodera et al.
patent: 4509522 (1985-04-01), Manuccia et al.
patent: 4525265 (1985-06-01), Abe et al.
patent: 4674879 (1987-06-01), Gregorig et al.
patent: 4769593 (1988-09-01), Reed et al.
patent: 4849687 (1989-07-01), Sims et al.
patent: 4857152 (1989-08-01), Armstrong et al.
patent: 5151660 (1992-09-01), Powers et al.
patent: 5157968 (1992-10-01), Zfira
patent: 5171523 (1992-12-01), Williams
patent: 5179926 (1993-01-01), Ament
patent: 5243858 (1993-09-01), Erskine et al.
patent: 5364510 (1994-11-01), Carpio
patent: 5439569 (1995-08-01), Carpio
patent: 5459568 (1995-10-01), Yano et al.
patent: 5470754 (1995-11-01), Rounbehler et al.
patent: 5600142 (1997-02-01), Van Den Berg et al.
patent: 5847276 (1998-12-01), Mimken et al.
patent: 5882590 (1999-03-01), Stewart et al.
patent: 5997685 (1999-12-01), Radhamohan et al.
patent: 6162409 (2000-12-01), Skelley et al.
patent: 6369387 (2002-04-01), Eckles
patent: 6454874 (2002-09-01), Jacobs et al.
patent: 6614242 (2003-09-01), Matter et al.
patent: 6660231 (2003-12-01), Moseley
patent: 6706648 (2004-03-01), Yamazaki et al.
patent: 6844742 (2005-01-01), Centanni
patent: 2002/0014410 (2002-02-01), Silveri et al.
patent: 2002/0033186 (2002-03-01), Verhaverbeke et al.
patent: 2002/0076492 (2002-06-01), Loan et al.
patent: 2002/0109511 (2002-08-01), Frank
patent: 2002/0111040 (2002-08-01), Yamazaki et al.
patent: 2002/0157686 (2002-10-01), Kenny et al.
patent: 2003/0063997 (2003-04-01), Fryer et al.
patent: 2003/0102007 (2003-06-01), Kaiser
patent: 2003/0157587 (2003-08-01), Gomez et al.
patent: 2004/0029257 (2004-02-01), Dutil et al.
patent: 2004/0079395 (2004-04-01), Kim et al.
patent: 2004/0178799 (2004-09-01), Korenev et al.
patent: 2004/0178802 (2004-09-01), Centanni
patent: 2004/0178803 (2004-09-01), Centanni
patent: 2004/0178804 (2004-09-01), Allen et al.
patent: 2004/0262170 (2004-12-01), Centanni
patent: 2005/0016828 (2005-01-01), Bednarek et al.
U.S. Appl. No. 10/456,378, filed Jun. 6, 2003, Centanni, entitled Method and Apparatus for Formulating and Controlling Chemical Concentrations in a Solution.
U.S. Appl. No. 10/456,380, filed Jun. 6, 2003, Centanni, entitled: Method and Apparatus for Formulating and Controlling Chemical Concentrations in a Gas Mixture.
U.S. Appl. No. 10/872,227, filed Jun. 18, 2004, Kaiser et al., entitled: Method and Apparatus for Monitoring the Purity and/or Quality of Steam.
U.S. Appl. No. 10/900,745, filed Jul. 28, 2004, Kaiser et al., entitled: Method and Apparatus for Monitoring the state of a Chemical Solution for Decontamination of Chemical and Biological Warfare Agents.
U.S. Appl. No. 10/931,186,filed Aug. 31, 2004, Kaiser et al., entitled: Method and Apparatus for Monitoring Detergent Concentration in a Decontamination Process.
T. J. Buckley et al., “Torodial Cross Capacitor for Measuring the Dielectric Constant of Gases,” Review of Scientific Instruments, vol. 71, No. 7, Jul. 2000, pp. 2914-2921.
Gross et al., “The Dielectric Constants of Water Hydrogen Peroxide and Hydrogen Peroxide-Water Mixtures,” L. Amer. Chem. Soc., vol. 72, 1950, pp. 2075-2080, May 1950.
“Humidity Sensor Theory and Behavior,” Psychometrics and Moisture, Honeywell HVAC, Nov. 27, 2002.
Philipp, “Charge Transfer Sensing,” 1997, month not available.
Wojslaw, “Everything You Wanted to Know About. Digitally Programmable Potentiometers,” Catalyst Semiconductor, Inc., Oct. 17, 2001, Publication No. 6009.
Kittel, “Introduction to Solid State Physics,” Fourth Edition, John Wiley & Sons, Inc., 1971, month not available.
Philipp, “The Charge Transfer Sensor,” Sensors Magazine, Oct. 1999.

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