Multiple sweep point testing of circuit devices

Details Multiple sweep point testing of circuit devices Multiple sweep point testing of circuit devices

Filed on

2005-12-13

Date issued

2005-12-13

Examiner

Nghiem, Michael (Department: 2863)

Patent Class

Data processing: measuring, calibrating, or testing

SubClass

Testing system

SubSubClass

Of circuit

Type

Reexamination Certificate

Status

active

Patent number

06975956

Description

ABSTRACT:
An efficient method and apparatus for characterizing circuit devices is disclosed. In one embodiment, multiple test patterns for testing a circuit device are stored in a tester. Each test pattern includes both test data and control data that defines at least in part a sweep point at which the circuit device is tested. Thus, the tester can generate stimulus vectors for multiple sweep points without requiring control system intervention. Pass/fail indicators, each of which represents pass/fail results associated with a sweep point, are derived from the test results and stored in a Fail Capture Memory. A pass/fail boundary of the DUT can be determined from the contents of the Fail Capture Memory.

REFERENCES:
patent: 6014764 (2000-01-01), Graeve et al.
patent: 6567942 (2003-05-01), Shepard, III
patent: 2004/0168104 (2004-08-01), Whetsel

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